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Nanoscale CMOS VLSI Circuits: Design for Manufacturability

ISBN10: 007163519X | ISBN13: 9780071635196

Nanoscale CMOS VLSI Circuits: Design for Manufacturability
ISBN10: 007163519X
ISBN13: 9780071635196
By Sandip Kundu and Aswin Sreedhar

Step 1 . Download Adobe Digital Editions to your PC or Mac desktop/laptop.

Step 2. Register and authorize your Adobe ID (optional). To access your eBook on multiple devices, first create an Adobe ID at account.adobe.com. Then, open Adobe Digital Editions, go to the Help menu, and select "Authorize Computer" to link your Adobe ID.

Step 3. Open Your eBook. Use Adobe Digital Editions to open the file. If the eBook doesn’t open, contact customer service for assistance.

Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product. Cutting-Edge CMOS VLSI Design for Manufacturability Techniques This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource. Nanoscale CMOS VLSI Circuits covers: Current trends in CMOS VLSI design Semiconductor manufacturing technologies Photolithography Process and device variability: analyses and modeling Manufacturing-Aware Physical Design Closure Metrology, manufacturing defects, and defect extraction Defect impact modeling and yield improvement techniques Physical design and reliability DFM tools and methodologies

Chapter 1. Introduction; Chapter 2. Semiconductor Manufacturing; Chapter 3. Process and Device Variability: Analysis and Modeling; Chapter 4. Manufacturing-Aware Physical Design Closure; Chapter 5. Metrology, Manufacturing Defects, and Defect Extraction; Chapter 6. Defect Impact Modeling and Yield Improvement Techniques; Chapter 7. Physical Design and Reliability; Chapter 8. Design for Manufacturability: Tools and Methodologies

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